Dual Normal Probe

Dual Normal Probe

All kinds of inspection solutions can be customized the chip size, shape, and focal length.

Dual Membrance Probe

Dual Membrance Probe

Used to inspect rough and uneven surface. Professional design of ultrasonic field ensure the best signal-to-noise characteristics.

Dual Longitudinal Wave Angle Probe

Dual Longitudinal Wave Angle Probe

Used to inspect coarse grain materials,Have better signal-to-noise. Customized focus styles of probe is our specialization.

Dual Shear Wave Probe

Dual Shear Wave Probe

Compared with single element angle probe,Dual Shear Wave Probe have better signal-to-noise characteristics in the near field.

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